Join the Round Robin:

Coating design

• Total coating thickness: approximately 2.2 µm
• Approximately 30 dielectric layers
• High reflection at 532 nm
• Transmission at 633 nm
   

Characterization of short-wavelength mirrors with respect to losses

• Reflectance and transmittance, measured by spectrophotometry or equivalent optical characterization methods
• Total optical loss and reflectance at 532 nm, determined by cavity ring-down measurements
• Absorption at 532 nm, measured by laser-induced deflection (LID)
• Stray light / total integrated scatter at 633 nm, characterized using FastTIS measurements
• Surface roughness, characterized by AFM
• Coating structure and layer build-up, analyzed by FIB-SEM in collaboration with Fraunhofer Institute for Microstructure of Materials and Systems (www.imws.fraunhofer.de); TEM may be performed on selected samples
• Laser-induced damage threshold at 532 nm, determined using ns-pulsed irradiation
• Coating stress, measured by interferometry
   

Data handling

All results will be presented anonymously. Each participant will receive the complete characterization results of their own samples, while the comparative analysis will remain anonymous.

f you are interested in participating or would like to learn more, please contact us at inforhysearchch. We would be pleased to provide further details and discuss the study with interested partners.

We look forward to bringing together the optical coating community to generate valuable benchmark data across different coating technologies.